InSPEC SEM Metrology Workshop @ MNE 2024 Montpellier

Join us for an exciting luncheon workshop at the MNE Montpellier on Wednesday, September 18th, 2024.

We will proudly introduce GenISys' new solution for integrated SEM metrology: InSPEC.

Time: Wednesday, 18th of September, 2024, 12:00 - 1:30 pm CEST
Place: Le Corum - Conference Center, France - Room JOFFRE A+B

InSPEC represents an integrated software suite and upgrade kit for automated multi-chip SEM metrology.

We will provide some background on the motivation for and key features of InSPEC as well as discuss application related solutions and typical use cases.

Don't miss out on this great opportunity to be among the first to witness these new capabilities for SEM metrology supporting nanofabrication. Limited seats are available, to secure your spot, please fill out the registration request below. Upon successful registration, you will receive a confirmation email with further details.

The luncheon event is free of charge. We will be very pleased to receive your registration requests. You are also welcome to forward this announcement to your colleagues who may be interested to join.

 


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